|Article#||Article Title & Authors||Page|
Jo Lyn Teh1, Moshiur Bhuiyan2, P. W. C. Prasad1, and Aneesh Krishna3*
Sherlock A. Licorish*
Amal Al-Abri1*, Zuhoor Al-Khanjari1, Yassine Jamoussi1,2, and Naoufel Kraiem1,2
Using Source Code and Process Metrics for Defect Prediction - A Case Study of Three Algorithms and Dimensionality Reduction
Wenjing Han, Chung-Horng Lung, Samuel Ajila*
Yi Jun Liu*
Allan Vidotti Prando1*, Solange Nice Alves de Souza2
Amna Noureen*, Anam Amjad, Farooque Azam
Ali Athar*, Rao Muzamal Liaqat, Farooque Azam
Wenshuang Yin, Changcheng Xiang, Dingding Yang, and Shiqiang Chen*
May 03, 2016 News!
Papers published in JSW Vol. 11, No. 1- Vol. 11, No. 11 have been indexed by DBLP. [Click]
Jan 05, 2017 News!
[CFP] 2017 the annual meeting of JSW Editorial Board, ICCSM 2017, will be held in Maldives, July 4-6, 2017. [Click]
Jan 12, 2017 News!
Vol 11, No. 12 has been published with online version 9 original aritcles from 4 countries are published in this issue. [Click]
Sep 21, 2016 News!
Vol.11, No.8 has been indexed by EI (Inspec). [Click]
Nov 17, 2015 News!
Welcome Prof. Karim El Guemhioui from Canada to join the Editorial board of JSW. [Click]