Volume 9 Number 9 (Sep. 2014)
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JSW 2014 Vol.9(9): 2267-2275 ISSN: 1796-217X
doi: 10.4304/jsw.9.9.2267-2275

A Cost-driven Approach for Metamorphic Testing

Jing Chen1, Fei-Ching Kuo2, Xiaoyuan Xie2, Lu Wang1
1Shandong Provincial Key Laboratory of Computer Network, Shandong Computer Science Center, Jinan 250014, China
2Faculty of Information and Communication Technologies, Swinburne University of Technology, Hawthorn, VIC 3122, Australia

Abstract—Metamorphic testing has been applied in various systems from different domains. Many studies showed that the selection of metamorphic relations greatly affected the effectiveness of metamorphic testing. However, these studies mainly focused on the fault-detection effectiveness. They did not consider the cost that metamorphic relations involved, such as the number of test inputs. Good metamorphic relations should have high fault-detection effectiveness with a low cost. In this paper, we propose a cost-driven approach for metamorphic testing. The key idea is to design metamorphic relations sharing the same test inputs to reduce the testing cost. We conduct a case study on a bank system and compare the cost-effectiveness of metamorphic relations derived from this approach and those constructed by the conventional approach. The experimental results show that metamorphic relations derived from our approach are more cost-effective. We also find that this approach not only reduces the cost of metamorphic testing, but also helps to construct different metamorphic relations to detect different types of faults.

Index Terms—software testing, metamorphic testing, metamorphic relation, cost-effectiveness


Cite: Jing Chen, Fei-Ching Kuo, Xiaoyuan Xie, Lu Wang, "A Cost-driven Approach for Metamorphic Testing," Journal of Software vol. 9, no. 9, pp. 2267-2275, 2014.

General Information

ISSN: 1796-217X (Online)
Frequency:  Bimonthly (Since 2020)
Editor-in-Chief: Prof. Antanas Verikas
Executive Editor: Ms. Yoyo Y. Zhou
Abstracting/ Indexing: DBLP, EBSCO, Google Scholar, ProQuest, INSPEC(IET), ULRICH's Periodicals Directory, WorldCat, etc
E-mail: jsw@iap.org
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