Volume 6 Number 9 (Sep. 2011)
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JSW 2011 Vol.6(9): 1746-1754 ISSN: 1796-217X
doi: 10.4304/jsw.6.9.1746-1754

A Line Segments Matching Method based on Epipolar-line Constraint and Line Segment Features

Jie-xian Zeng1, 2, Sheng Yu2, Xiang Fu1, Chao-xia Li3
1School of Software, Nangchang Hangkong University, Nanchang, Jiangxi, China
2Key Laboratory of Nondestructive Test (Ministry of Education) Nangchang Hangkong University, Nanchang, Jiangxi, China
3National Key Laboratory of Science and Technology on Avionics System Integration, Shanghai, China


Abstract—Line segments are ordinary in industrial scene, accurate line segments matching is a key step for many applications, such as 3-D reconstruction. A matching method based on epipolar-line constraint and line segment features is proposed. Firstly, the points on line segments between image pairs are matched by epipolar-line constraint. Secondly, geometric descriptor and gray value descriptor are used to describe the line segment features, then the two descriptors are combined into a feature vector, and Euclidean distance between vectors is used to achieve fine match. Experiment results show that the proposed method is accurate and fast.

Index Terms—epipolar-line constraint; line segment featrurs; line segments matching

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Cite: Jie-xian Zeng, Sheng Yu, Xiang Fu, Chao-xia Li, "A Line Segments Matching Method based on Epipolar-line Constraint and Line Segment Features," Journal of Software vol. 6, no. 9, pp. 1746-1754, 2011.

General Information

ISSN: 1796-217X (Online)
Frequency: Monthly (2006-2019); Bimonthly (Since 2020)
Editor-in-Chief: Prof. Antanas Verikas
Executive Editor: Ms. Yoyo Y. Zhou
Abstracting/ Indexing: DBLP, EBSCO, Google Scholar, ProQuest, INSPEC, ULRICH's Periodicals Directory, WorldCat, etc
E-mail: jsw@iap.org
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