doi: 10.4304/jsw.6.9.1746-1754
A Line Segments Matching Method based on Epipolar-line Constraint and Line Segment Features
- 1 School of Software, Nangchang Hangkong University, Nanchang, Jiangxi, China
- 2 Key Laboratory of Nondestructive Test (Ministry of Education) Nangchang Hangkong University, Nanchang, Jiangxi, China
- 3 National Key Laboratory of Science and Technology on Avionics System Integration, Shanghai, China
Abstract
Line segments are ordinary in industrial scene, accurate line segments matching is a key step for many applications, such as 3-D reconstruction. A matching method based on epipolar-line constraint and line segment features is proposed. Firstly, the points on line segments between image pairs are matched by epipolar-line constraint. Secondly, geometric descriptor and gray value descriptor are used to describe the line segment features, then the two descriptors are combined into a feature vector, and Euclidean distance between vectors is used to achieve fine match. Experiment results show that the proposed method is accurate and fast.
Keywords
- epipolar-line
- constraint;
- line
- segment
- f
How to Cite
Jie-xian Zeng, Sheng Yu, Xiang Fu, and Chao-xia Li, "A Line Segments Matching Method based on Epipolar-line Constraint and Line Segment Features," Journal of Software, vol. 6, no. 9, pp. 1746-1754, 2011. https://doi.org/ 10.4304/jsw.6.9.1746-1754
Copyright & License
Copyright © 2011 by the authors. This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).