Department of Applied Mathematics, Indian School of Mines, Dhanbad, Jharkhand, India.

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Abstract—In past four decades, many software reliability growth models (SRGMs) have been proposed to enhance the reliability of the software system. During the testing process potential fault sites are sensitized to detect the faults. Fault detection probability increases as learning and maturity of the testing personnel increases. Therefore, in this paper a time variant fault detection probability has been introduced and integrated into s-shaped coverage SRGM. Experimental results shows that the proposed model is better and will be helpful to improve the accuracy of the software reliability estimation.

Index Terms—exponential fault detection probability, non-homogeneous Poisson process (NHPP), software reliability growth model, software reliability, s-shaped testing coverage.

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Cite: Subhashis Chatterjee*, Ankur Shukla, "Effect of Test Coverage and Change Point on Software Reliability Growth Based on Time Variable Fault Detection Probability," Journal of Software vol. 11, no. 1, pp. 110-117, 2016.