Volume 10 Number 5 (May 2015)
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JSW 2015 Vol.10(5): 551-565 ISSN: 1796-217X
doi: 10.17706/jsw.10.5.551-565

A Coarse-to-Fine Registration Method Based on Geometric Constraints and Parallel Architecture

Zetao Jiang1, Chuan Guo2*, Yang Yang2
1Guilin University of Electronic Technology, Guilin, China. Nanchang Hangkong University, Nanchang, China
2Nanchang Hangkong University, Nanchang, China

Abstract—Aiming at solving lengthy time-consuming registration and mismatch problems caused by images which have feature simliarity of local region in the traditional SIFT (Scale Invariant Feature Transform) registration method, a fine registration method based on geometric constraints and parallel architecture is put forward. First, in order to provide geometric constraints for block and fine registration, we use SIFT algorithm parallelly extract feature points to calculate initial transform matrix. Then, segment the overlapping region of original image pairs into several blocks. Finally, to achieve fine registration, blockwise SIFT matching and eliminate the mismatch through geometric constraints are implemented on parallel architecture. During the fine registration, we use geometric constraints and affine invariance of Mahalanobis distance to screen feature points and eliminate duplicate matches and mismatches. The experimental results show that this method has eliminated the mismatch generated by same local features. Moreover, registration accuracy and speed have been improved, the proposed approach has practical value.

Index Terms—Image registration, geometric constraints, affine invariant, block strategy, parallel.


Cite: Zetao Jiang, Chuan Guo, Yang Yang, "A Coarse-to-Fine Registration Method Based on Geometric Constraints and Parallel Architecture," Journal of Software vol. 10, no. 5, pp. 551-565, 2015.

General Information

ISSN: 1796-217X (Online)
Frequency:  Bimonthly (Since 2020)
Editor-in-Chief: Prof. Antanas Verikas
Executive Editor: Ms. Yoyo Y. Zhou
Abstracting/ Indexing: DBLP, EBSCO, Google Scholar, ProQuest, INSPEC(IET), ULRICH's Periodicals Directory, WorldCat, etc
E-mail: jsw@iap.org
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